Integrated circuit aging test socket This product is used in aerospace, military industry, scientific research units and integrated circuit manufacturers. It can be equipped with imported aging tables, aging boards for components and high and low temperature testing, aging screening for connection: product model and specifications; IC-8J, IC-14J, IC-16J, IC-18J, IC-18J (K) wide span, IC-20J, IC-24J, IC-24Z narrow foot, IC-28J, IC-28J (K) wide Span, IC-40J main technical indicators; spacing; 2.54mm ambient temperature; -55℃—+155℃ insulation resistance; ≤0.01 ohm working voltage; DC500V single-pin insertion force; ≤0.2Kg gold layer thickness of shrapnel; 2umAu:lu( Nickel gold) plug life; plug life under high and low temperature conditions; 2000-3000 times.

TO package integrated circuit aging test socket. This socket is used for the aging, testing and screening of metal shell packaged integrated circuits for connection. The connection metal tube material adopts phosphor bronze surface gold plating, silver plating, nickel plating and other processes. The socket is resistant to high temperature, It has good insulation performance and durability, which is very popular among users. Product model and specification; TO-4, 6, 8, 10, 12 main technical indicators; ambient temperature; -20℃—+255℃ contact resistance; ≤0.01 ohm working voltage; DC500V single-pin insertion force; ≤0.2Kg phosphor bronze Tube silver plating thickness; 1um nickel 2um silver plug life under high and low temperature conditions; 2000-3000 times.

IC integrated circuit aging test socket (DIP package) Detailed introduction:

Integrated circuit aging test socket This series of fixtures is suitable for the aging, testing, screening and reliability test of DIP packaged dual in-line integrated circuits for connection. This product is widely used in aerospace, military industry, scientific research institutes, electronics, communication product models and specifications; IC-8J, IC-14J, IC-16J, IC-18J, IC-18J (K) wide span, IC-20J , IC-24J, IC-24Z narrow feet, IC-28J, IC-28J (K) wide span, IC-40J main technical indicators; spacing; 2.54mm ambient temperature; -55℃—+155℃ contact resistance; ≤0.01 European working voltage; DC500V single pin insertion force; ≤0.2Kg gold layer thickness of shrapnel; 1um nickel 2um gold plug life; high and low temperature plug life; 2000-3000 times.

IC aging test socket:

This product is used in aerospace, military industry, scientific research units and integrated circuit manufacturers. It can be equipped with imported aging tables, aging boards as devices, and high and low temperature testing and aging screening for connection:

Product model and specifications;

IC-8J, IC-14J, IC-16J, IC-18J, IC-18J (K) wide span, IC-20J, IC-24J, IC-24Z narrow foot, IC-28J, IC-28J (K) wide Span, IC-40J

Main Specifications;

Spacing; 2.54mm ambient temperature; -55℃—+155℃

Insulation resistance; ≤0.01 ohm working voltage; DC500V

Single leg insertion force; ≤0.2Kg gold layer thickness of shrapnel; 2umAu:lu (nickel gold)

Mating life; Mating life under high and low temperature conditions; 2000-3000 times