IC aging test seat This product is used in aerospace, military, scientific research units and integrated circuit manufacturing companies, can be equipped with imported aging stations, aging boards for devices and high and low temperature testing, aging screening for connection purposes: product model and specifications; IC-8J, IC-14J, IC-16J, IC-18J, IC-18J(K) Wide Span, IC-20J, IC-24J, IC-24Z Narrow Leg, IC-28J, IC-28J(K) Wide Span, IC-40J main technical specifications; Pitch; 2.54mm Ambient temperature; -55°C—+155°C Insulation resistance; ≤0.01 ohms working voltage; DC500V insertion force of one foot; ≤0.2Kg thickness of shrapnel gold layer; 2umAu:lu ( Nickel Gold) Insertion and extraction life; high and low temperature plug life; 2000-3000 times.

TO packaging integrated circuit aging test socket This socket is used for aging, testing and screening of metal shell packaged integrated circuits. The connection metal tube material uses phosphor bronze surface gold plating, silver plating, nickel plating and other processes, the socket is resistant to high temperature, Good insulation performance, durability, and welcomed by users. Model and specification; TO-4,6,8,10,12 Main technical specifications; Ambient temperature; -20°C—+255°C Contact resistance; ≤0.01 ohm working voltage; DC500V single foot insertion force; ≤0.2Kg phosphor bronze Silver plate thickness; 1um nickel 2um silver high and low temperature plug life; 2000-3000 times.

IC IC aging test seat (DIP package) Details:

Integrated Circuit Aging Test Bench This series of fixtures is suitable for the connection of DIP packaged dual in-line integrated circuits for aging, testing, screening, and reliability testing. The product is widely used in aerospace, military, scientific research institutes, electronics, communications product models and specifications; IC-8J, IC-14J, IC-16J, IC-18J, IC-18J (K) wide span, IC-20J , IC-24J, IC-24Z narrow feet, IC-28J, IC-28J (K) wide span, IC-40J main technical indicators; spacing; 2.54mm ambient temperature; -55 °C - +155 °C contact resistance; ≤ 0.01 Operating voltage in Europe; DC500V insertion force for one leg; ≤0.2Kg gold thickness of shrapnel; 1um nickel 2um gold plug life; high and low temperature plug life; 2000-3000 times.

IC aging test stand:

This product is used in aerospace, military, scientific research and integrated circuit manufacturing companies. It can be equipped with imported weathering tables, aged boards for high- and low-temperature testing, and aging screening for connection purposes:

Product model and specifications:

IC-8J, IC-14J, IC-16J, IC-18J, IC-18J(K) Wide Span, IC-20J, IC-24J, IC-24Z Narrow Leg, IC-28J, IC-28J(K) Wide Span, IC-40J

Main Specifications;

Pitch: 2.54mm ambient temperature; -55°C—+155°C

Insulation resistance: ≤0.01 ohms working voltage; DC500V

One-legged insertion force: ≤0.2Kg shrapnel gold layer thickness; 2umAu:lu (nickel gold)

Plug life: high and low temperature plug life; 2000-3000 times